The ISL55100B is a compact, high-performance quad driver and window comparator IC designed for test during burn-in and automated testing applications. It features four programmable channels with independent driver levels, high impedance controls, and dual comparators with high and low threshold settings. Capable of interfacing directly with LVDS, CML, TTL, and CMOS signals, it supports an 18V input/output range and operates at frequencies up to 50MHz. Its small form factor, low resistance output stage, and user-defined thresholds make it ideal for wafer and flash memory testing, LCD panel testing, and instrumentation where space and power efficiency are critical.
Driver Output Resistance: Typical 9Ω at 125mA load
Maximum Driver Output Current: 125mA per channel
Operating Frequency: Up to 50MHz
Input Voltage Range: DATA, DRVEN, CVX, VH, VL, VINP, COMPX from -0.5V to (Veg + 0.5V)
Output Voltage Levels: Driven to user-defined VH and VL
Power Dissipation: Based on data rates and load conditions, thermal considerations for junction temperature up to +150°C
Threshold Setting: Independent for each comparator via CVA and CVB pins
Input Impedance: High, with differential or single-ended digital inputs
Temperature Range: -40°C to +85°C
RoHS compliant and Pb-free
Buy the Intersil ISL55100B – Reliable Test Driver/Comparator for Industrial Applications
Purchase the Intersil ISL55100B now to enhance your automation and testing solutions. This compact, high-frequency driver and window comparator IC offers independent channel control, user-defined thresholds, and compatibility with diverse logic levels. Its small footprint and high current drive capabilities make it ideal for wafer testing, flash memory verification, LCD testing, and instrumentation. Leverage its reliable performance for efficient, cost-effective testing in industrial setups. Order online today for fast delivery and support your production needs with confidence.
Get Intersil ISL55100B today—built for precision testing, robust operation, and durable performance in automated manufacturing and device testing environments.
Frequently Asked Questions
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