The P100-E4-250-G from Multicomp is a large spring probe designed for reliable electrical testing applications. It features a spring-loaded plunger with a travel distance of 6.3mm and a spring pressure of 250 grams. The connector has a minimum center distance of 2.54mm, with a contact resistance of 50 milliohms. Made from gold over nickel-plated full hard beryllium copper, it offers durable performance with a minimum lifespan of 100,000 cycles. Suitable for diverse testing setups, it provides consistent, high-precision connections for electronic testing and measurement tasks.
Order the Multicomp P100-E4-250-G spring probe online today to benefit from high-quality electronic testing components. Designed for durability, it features a 6.3mm travel, 3A current rating, and gold-plated contacts for consistent, reliable connections. Perfect for complex testing and measurement setups, this spring probe supports over 100,000 cycles, ensuring long-lasting performance. Easy to integrate into your testing environment, this versatile probe guarantees precise contact for high-performance electronics testing, measurement, and automation applications. Enhance your testing capabilities now by purchasing online.
You can click on the BUY or RFQ button to purchase P100E4250G from an authorized MULTICOMP distributor.
You can download the P100E4250G datasheet or visit the MULTICOMP website for support.
MULTICOMP